[ Technical Papers ]

Journal of the Korean Society of Manufacturing Technology Engineers - Vol. 29, No. 4, pp.339-343

ISSN: 2508-5107 (Online)

Print publication date 15 Aug 2020

Received 22 Apr 2020 Revised 10 Jul 2020 Accepted 22 Jul 2020

DOI: https://doi.org/10.7735/ksmte.2020.29.4.339

인쇄전자 패턴의 핀홀 측정 방법 개발

김충환^a^{, *}

Development of a Measurement Method for Pinholes in the Printed Patterns of Printed Electronics

Chung Hwan Kim^a^{, *}

aDept. of Mechanical & Material Engineering Education, Chungnam National Univ.

Correspondence to: ^*Tel.: +82-42-821-8584 E-mail address: mech@cnu.ac.kr (Chung Hwan Kim).

Abstract

In printed electronics technology, the pinholes in the printed pattern voids can affect the quality or performance of printed electronic devices. Therefore, it is important to measure and control the pinholes in printed patterns during the manufacturing process. The pinhole has a three-dimensional (3D) shape and should be measured using a 3D microscope for accurate measurement. However, such equipment is typically too expensive to be acquired by a small-sized company. This paper proposes a measurement method for pinholes in printed patterns, involving pattern images obtained using a relatively inexpensive 2D microscope. The proposed method is based on a pinhole threshold index, which defines the boundary between the pinhole and pattern. The actual measurement results are shown to have varying threshold indices. This research contributes to the advancement of the printed electronics industry.

Keywords:

Printed electronics, Pattern, Pinhole, Measurement

Acknowledgments

이 연구는 충남대학교 학술연구진흥사업에 의해 지원되었음.

References

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Chung Hwan Kim

Professor in the Department of Mechanical & Material Engineering Education, Chungnam National University.He is also working as the convener of working group of international standardization for Printed Electronics, IEC TC119.

E-mail: mech@cnu.ac.kr