유한요소법을 이용한 유연소자용 Au 나노구조체의 내구성 평가
초록
In this study, the levels of durability of nanostructures for flexible devices are explored based on tensile force, bending moment, and torsion. First, for application to optical devices, aluminium nanostructures are fabricated using laser interference lithography. The optical characteristics of the fabricated nanopatterns are investigated, and the structure with the highest light transmittance is selected for durability analysis. A structural analysis model using the finite element method is then developed and its reliability is validated through a comparison with the experimental data for both polyethylene terephthalate and Au thin films. Finally, the different levels of durability of the nanostructures are investigated for application based on tensile force, bending moment, and torsion. The structural weakness of each nanostructure is explored and the durability characteristics are highlighted.
Keywords:
Nanostructure, Laser interference lithography, Flexible device, FEM (Finite Element Method), DurabilityAcknowledgments
이 논문은 2017학년도 한밭대학교 대학회계연구비를 지원받아 작성되었음.
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M.Sc. in the Department of Mechanical Engineering, Hanbat National University.His research interest includes nanostructures.
E-mail: onam2100@naver.com
Professor in the Department of Mechanical Engineering, Hanbat National University.His research interest includes flexible electronic devices.
E-mail: hsyoun@hanbat.ac.kr