[ Technical Papers ]

Journal of the Korean Society of Manufacturing Technology Engineers - Vol. 28, No. 2, pp.132-138

ISSN: 2508-5107 (Online)

Print publication date 15 Apr 2019

Received 26 Nov 2018 Revised 14 Jan 2019 Accepted 25 Jan 2019

DOI: https://doi.org/10.7735/ksmte.2019.28.2.132

광픽업 유닛 기반 원자현미경의 Dynamic 모드 측정용 Lock-in Amplifier

Mark A. Cruz^a ; 송수환^b ; 이상헌^c^{, *}

Lock-in Amplifier for Dynamic Imaging of OPU Based Atomic Force Microscopy

Mark A. Cruz^a ; Su-Hwan Song^b ; Sang Heon Lee^c^{, *}

aDepartment of Engineering, Aurora State College of Technology, Sitio Dicaloyungan, Brgy. Zabali Baler, Aurora3200, Philippines
bKorea Institute of Robot & Convergence, 1486-18, Gyungdong-ro, Andong, Gyeongbuk-do, 36728, Korea
cDepartment of Mechanical Design Engineering, Andong National University, 1375, Gyungdong-ro, Andong, Gyeongbuk-do, 36729, Korea

Correspondence to: ^*Tel.: +82-54-820-5908 Fax: +82-54-820-7913 E-mail address: shlee@andong.ac.kr (Sang Heon Lee).

Abstract

In this paper, we introduce a lock-in amplifier for the dynamic mode operation of atomic force microscopy, based on the optical pickup unit of a DVD. We fabricated a lock-in amplifier, which is fundamentally based on the principle of the dual phase mode, and included an additional enhancement structure to ensure high bandwidth, so that it is capable of supporting high-speed scanning probe microcopy in the future. We performed a basic experiment for performance evaluation and dynamic mode imaging of a standard sample by applying the fabricated lock-in amplifier module to a pre-developed optical pickup unit based atomic force microscopy.

Keywords:

Lock-in amplifier, Displacement sensor, Atomic force microscopy, Scanning probe microscopy, Dynamic imaging mode

Acknowledgments

이 논문은 2016년도 안동대학교 연구비에 의해 연구되었음.

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