열전소자를 이용한 반도체 검사용 자동 온도제어 모듈 개발
초록
In semiconductor manufacturing processes, the final inspection is a crucial last test stage for screening defective parts before delivery to customers. Since traditional convection-based temperature control has limitations and requires time for a solution, this study focuses on the development and verification of an automatic temperature control technology using conduction-based thermoelectric modules. From the performance tests, it is found that the module operates in the temperature range of –40℃ to 120℃, and all channels achieve temperature transitions at each step within 6 min. The temperature module shows accuracy variations of –0.8℃ to 1.9℃ over the entire stage, which fulfills the semiconductor industry requirement of within ±2℃ for inspection equipment.
Keywords:
Thermoelectric module (TEM), Semiconductor test equipment, Auto temperature control module, Temperature range, Temperature change time, Temperature precisionAcknowledgments
이 논문은 2019년도 한국기술교육대학교 교수 교육연구진흥과제 지원에 의하여 연구되었습니다.
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Ph.D. candidate in the School of Mechanical Engineering, Korea University of Technology and Education.His research interest is mechanical engineering.
E-mail: dsson@koreatech.ac.kr
Ph.D. candidate in the School of Mechanical Engineering, Korea University of Technology and Education.Her research interest is mechanical engineering, injection molding and precision measurement.
E-mail: sunny61@koreatech.ac.kr