웨이퍼 핸들링을 위한 collet의 외관 비전 검사 장치 개발
Abstract
In semiconductor manufacturing, small and precise tools such as collets are used during the assembly process to control and improve product quality. Monitoring the quality of the collet, such as its shape, size, and hole, is crucial for ensuring high reliability when picking up a cut wafer during the semiconductor packaging process. In this study, we propose a defect detection algorithm using image processing techniques. The application was implemented in a visual C++ environment, which enables motion control, image acquisition control, and the execution of image processing algorithms. The test and analysis of the collet inspection system yielded a defect detection rate of 99.3%.
Keywords:
Collet, Visual inspection, Auto focus, Calibration, Image processingAcknowledgments
이 연구는 한라대학교의 연구비 지원을 받아 이루어졌음에 감사드립니다.
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Professor in the Department of Future Mobility, Halla University. His research interest is Machine Vision.
E-mail: kukwon.ko@halla.ac.kr
Professor in the Department of AI Convergence Security, Halla University. Her research interest is BigData Analysis.
E-mail: jiyoen.lee@halla.ac.kr